Highlights removal using reflected energy and histogram analysis

  • Javed Khan PhD student in Universiti Teknologi PETRONAS
  • Aamir Saeed Malik Universiti Teknologi PETRONAS
  • Nidal Kamel Associate professor, Department of Electrical & Electronics Engineering, UTP, Malaysia.
  • Sarat Chandra Dass Department of Fundamental & Applied Sciences, UTP, Malaysia
Keywords: Specular reflection, diffuse reflection, statistical analysis, local information, highlights

Abstract

The occurrence of highlights in digital photography is an unwanted phenomenon in computer vision and image analysis. It overshadows the intrinsic color information of objects in a scene and makes computer vision algorithms to produce erroneous results. In this paper, two techniques are proposed; one for removing highlights due to both diffuse and specular components and the other one for removing highlights due to the specular component only. The former is based on the modified Torrance-Sparrow model of specular reflection while the later technique combines Torrance-Sparrow model with local statistical analysis and recovers the color of highlights by interpolation. The results are validated on both synthesized and real images and compared with several contemporary highlights removal techniques. The comparison shows that performance of the proposed techniques is comparable or slightly better than the previously proposed techniques.

Author Biographies

Javed Khan, PhD student in Universiti Teknologi PETRONAS
PhD student at the Department of Electrical & Electronics Engineering, UTP, Malaysia.
Aamir Saeed Malik, Universiti Teknologi PETRONAS

Associate professor, 

Department of Electrical & Electronics Engineering,

Universiti Teknologi PETRONAS

 

Nidal Kamel, Associate professor, Department of Electrical & Electronics Engineering, UTP, Malaysia.

Associate professor,
Department of Electrical & Electronics Engineering, UTP, Malaysia.

Sarat Chandra Dass, Department of Fundamental & Applied Sciences, UTP, Malaysia

Associate professor 

Department of Fundamental & Applied Sciences, UTP, Malaysia.

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Published
2019-05-06
Section
Computer Engineering